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3. Silicon samples with band-gas 1.1 eV at 300 Kelvin, are doped at four different levels and have the properties listed belo
3. Silicon samples with band-gas 1.1 eV at 300 Kelvin, are doped at four different levels and have the properties listed belo
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​​​​​​​The Pats given inthe 9resitien is as tollouos 8ilicm Sample With Band gap- E Caee-I When Ee-Ev o.15 ev 1lev Semi(onducter Wewe, Knaa that Trtinstc Concentration Fr Sicon mie-a Now Mass actin Lau- Meins npani No PE ni P-2-25xi 3-92X10 P- 5.89x1o1 Fraase m When EF-Ev 0 35 ev again vaing equtin Ea-CEr-EN)= KTin -1- 0-35- 0-026n 2.82Xld No O55 2.324 o26 (जग) 2.32XL019 (-53 xlConclu sion Ce- Nom degemate tyfe SemiCm ducter Case-IT-Nm degemte N-tpe Semi Gnduetor Case- pproxine tely equatto nbingic Co​​​​​​​

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