Question

The Chief Technology Officer (CTO) at a local high-tech manufacturing plant wants to reduce the number of bad silicon chips that cannot be used and must be scrapped (costing the company money). He works with the company’s engineers to find ways of changing their manufacturing process to reduce the number of bad chips produced. They finally find a solution they think will work. Before implementing the new process throughout the entire company at great cost, the research team tests the new process in randomly selected machines (n = 9) first to see if the process reduces the amount of scrap. Conduct a two-tailed test (alpha = .05).

Here are the data:

Number of bad chips before the new process: mu = 5,000 (sigma = 3,000)

Number of bad chips after the new process: M = 4,500

a.

What is the critical value of z for this test? (i know what it is but how do you get it?)

b.

Compute the standard error of the mean this test:

c.

Compute z obtained for this test (round to one decimal)

d.

Compute the 95% confidence interval for the number of bad chips produced. Enter the answer in this form: lower limit, upper limit

Answer 1

3000 conclusion - rhir is suF Lidence Hypotnesis lower B oun Hence Requred coneie in