A Si PN junction diode has constant doping at both sides, Na and Nd in P and N side, respectively. The width of the P side is W and the width of the N side is L: W << Le and L >> Lh. Le and Lh are the minority carrier diffusion length in each side. The lifetime of both minority carriers is τ. Assume the contacts at both ends of the PN junction are Omic contact. The PN junction is under forward bias Va.
(a) At low-injection condition, find and sketch the minority-carrier concentrations in the neutral regions of the diode, in terms of Ln, Lp and τ.
(b) Find and sketch the current flows in each side of the PN junction, in terms of Ln, Lp and τ.
The following figure shows the minority carrier concentration of pn diode under forward bias.



b)

A Si PN junction diode has constant doping at both sides, Na and Nd in P...
3.13 Si pn junction Consider a long pn junction diode with an acceptor doping Naof 1018 cm-3 on the p-side and donor concentration of Nj on the n-side. The diode is forward biased and has a voltage of 0.6 V across it. The diode cross-sectional area is 1 mm2. The minority carrier recombination time, T, depends on the total dopant concentration, Ndopant (cm), through the following approximate empirical relation (5x 10-7)/(1 + 2 10-17N1°pan.) where T is in seconds. (a)...
3.13 Si pn junction Consider a long pn junction diode with an acceptor doping Naof 1018 cm-3 on the p-side and donor concentration of Nj on the n-side. The diode is forward biased and has a voltage of 0.6 V across it. The diode cross-sectional area is 1 mm2. The minority carrier recombination time, T, depends on the total dopant concentration, Ndopant (cm), through the following approximate empirical relation (5x 10-7)/(1 + 2 10-17N1°pan.) where T is in seconds. (a)...
P3. For an ideal abrupt silicon (Si) P*N diode with doping concentrations Na = 1 x 107 cm3 and N 1 x 105 cm. (a) Find the stored minority carriers density in the N-side neutral region (infinitely long comparing with Lp and Ln) when a forward bias of 1 V is applied. (b) Calculate the hole current density in the region of (a) at x, 0. (Assume the average diffusion length of hole is 5 um the average carrier life...
P3. For an ideal abrupt silicon (Si) P*N diode with doping concentrations Na = 1 x 107 cm3 and N 1 x 105 cm. (a) Find the stored minority carriers density in the N-side neutral region (infinitely long comparing with Lp and Ln) when a forward bias of 1 V is applied. (b) Calculate the hole current density in the region of (a) at x, 0. (Assume the average diffusion length of hole is 5 um the average carrier life...
this is a problem of semiconductor device and
fundamentals.
Problem 4: pn Junction Current Distributions Consider a Si pn step junction diode maintained at room temperature, with p-side and n-side dopant concentrations NA 1016 cm3 and Np-2x1016 cm3, respectively. (You may assume that each side is uncompensated.) The minority carrier recombination lifetimes are τ,-10-6 s and τ,-10-7 s on the p-side and n-side, respectively a) Calculate the minority carrier densities at the edges of the depletion region when the applied...
Problem 4 (25 points) Consider a silicon pn junction at T-300 K, NA-ND- 1x101° cm3. The minority carrier lifetimes are τ n-0.01 μs and τ p-0.01 us. The junction is forwardbiased with Va 0.6V. The minority carrier diffusion coefficients are Dn-20 cm s, Dp 10 cm Is. n.-1.5x 1010 cm-3 Depletion region n-type p-type a) (10 points) Calculate the excess electron concentration as a function of x in the p side (see the figure above). b) (5 points) Calculate the...
1. Given an ideal p-n Si diode such that the thickness of quasi-neutral regions on both sides of the junction, D, is such that D<<Lp or Ln. Assume NA=ND, Dp=DN and under forward bias minority carriers that travel farther than D on either side of the junction have a lifetime of 0, find the numerical value of JN/Jp under forward bias. Briefly explain how you arrive at your answer. (Hint: know your boundary conditions)
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Problem 4 (25 points) Consider a silicon pn junction at T-300 K, NA-ND- 1x101° cm3. The minority carrier lifetimes are τ n-0.01 μs and τ p-0.01 us. The junction is forwardbiased with Va 0.6V. The minority carrier diffusion coefficients are Dn-20 cm s, Dp 10 cm Is. n.-1.5x 1010 cm-3 Depletion region n-type p-type a) (10 points) Calculate the excess electron concentration as a function of x in the p...
Problem 4 (25 points) Consider a silicon pn junction at T-300 K, N,-1x1017 ст?, ND-11016 Cm -, The minority carrier lifetimes are τ u-^ 1 μs and τ p-1 μs. The minority carrier diffusion coefficients are Da-25 cm2/s, DR-10 cm2/s. n1-1.5x1010 cm -3 kT - 0.026V Low-level injection is defined to be when the minority carrier concentration at the edge of the space charge region becomes equal to one-tenth the majority carrier concentration. Determine the value of the voltage across...
Consider a silicon pn junction at T = 300 K, NA-Np - 4x106cm. The minority carrier lifetimes are tn = Tp=1 us. The junction is forward biased with V, -0.6V. The minority carrier diffusion coefficients are D = 20 cm²/s, D = 10 cm²/s. n;= 1.5x100cm, kt/e = 0.026V Depletion region n-type p-type a) (5 points) Do we have low-level injection? b) (10 points) Calculate the electron concentration at x = -(Xp + Ln) where L, is the electron diffusion...